Methods for quantifying the elemental and molecular composition of materials are essential across all fields of science and engineering. Material surfaces provide the most accessible and, in many cases, the only source for understanding material composition. This course will review basic properties of surfaces and modern techniques for surface analysis. Techniques covered include X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectroscopy (ToF-SIMS), Auger electron spectroscopy, low-energy ion scattering, X-ray and neutron scattering, scanning probe microscopy, Raman and Infrared spectroscopy, X-ray absorption, and surface energy measurements. Prior experience with surface analysis is not required. This course can be taken concurrently with the Surface Science Lab.